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Enhanced resistive switching performance and structural evolution of NiO/Nb2O5−x bilayer memristive device

Chien-Hua Wang, Hung‐Yang Lo, Chun‐Wei Huang, Jui-Yuan Chen, Wen‐Wei Wu

2024Journal of Alloys and Compounds11 citationsDOI

Topics & Concepts

Resistive random-access memoryNon-blocking I/OBilayerMaterials scienceX-ray photoelectron spectroscopyOptoelectronicsTransmission electron microscopyCrystalliteNanotechnologyMonolayerVoltageChemical engineeringChemistryElectrical engineeringMetallurgyEngineeringCatalysisMembraneBiochemistryAdvanced Memory and Neural ComputingTransition Metal Oxide NanomaterialsCCD and CMOS Imaging Sensors
Enhanced resistive switching performance and structural evolution of NiO/Nb2O5−x bilayer memristive device | Litcius