Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM
S. Tōyama, Takehito Seki, Yuya Kanitani, Yoshihiro Kudo, Shigetaka Tomiya, Yuichi Ikuhara, Naoya Shibata
Topics & Concepts
HeterojunctionElectric fieldDiffractionMaterials scienceOpticsSemiconductorTilt (camera)Contrast (vision)Transmission electron microscopyOptoelectronicsPhysicsMathematicsGeometryQuantum mechanicsAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesGaN-based semiconductor devices and materials