Origins and characterization techniques of stress in SiC crystals: A review
Jiaqi Tian, Xuejian Xie, Laibin Zhao, Xinglong Wang, Xiufang Chen, Xianglong Yang, Yan Peng, Xiaomeng Li, Xiaobo Hu, Xiangang Xu
Topics & Concepts
Characterization (materials science)Stress (linguistics)Materials scienceNanotechnologyCrystallographyChemistryPhilosophyLinguisticsSilicon Carbide Semiconductor TechnologiesAdvanced ceramic materials synthesisAluminum Alloys Composites Properties