Microstructure and residual stress evolution in nanocrystalline Cu-Zr thin films
J. Chakraborty, Tobias Oellers, R. Raghavan, Alfred Ludwig, Gerhard Dehm
Topics & Concepts
Materials scienceMicrostructureNanocrystalline materialThin filmResidual stressAlloyComposite materialCrystallographyMetallurgyNanotechnologyChemistryMicrostructure and mechanical propertiesAluminum Alloy Microstructure PropertiesAluminum Alloys Composites Properties