A robust SVM-based approach with feature selection and outliers detection for classification problems
Marta Baldomero‐Naranjo, Luisa I. Martínez-Merino, Antonio M. Rodríguez‐Chía
Topics & Concepts
Support vector machineFeature selectionComputer scienceOutlierArtificial intelligenceClassifier (UML)Pattern recognition (psychology)HeuristicAnomaly detectionMachine learningMargin classifierData miningAdvanced Statistical Methods and ModelsFault Detection and Control SystemsFace and Expression Recognition