Accurate extrinsic and intrinsic peak broadening modelling for time-resolved <i>in situ</i> ball milling reactions <i>via</i> synchrotron powder X-ray diffraction
Paolo P. Mazzeo, Giulio I. Lampronti, Adam A. L. Michalchuk∞, Ana M. Belenguer, Alessia Bacchi, Franziska Emmerling
Abstract
conditions. Using TRIS-XRPD on a ball milling setup, coupled with low-energy synchrotron radiation, we investigated different data acquisition and analysis strategies on a silicon standard powder. The diffraction geometry and the microstructural evolution of the standard itself have been studied to model the instrumental contribution to XRPD peak broadening throughout the grinding activity. Previously proposed functions are here challenged and further developed. Importantly, we show that minor drifts of the jar position do not affect the instrumental resolution function significantly. We here report and discuss the results of such investigations and their application to TRIS-XRPD datasets of inorganic and organic ball mill grinding reactions.