Characterization of the atomic-level structure of γ-alumina and (111) Pt/γ-alumina interfaces
Arielle L Clauser, Kofi Oware Sarfo, R. Giulian, Colin Ophus, Jim Ciston, Líney Árnadóttir, Melissa K. Santala
Topics & Concepts
Materials sciencePlatinumAnnealing (glass)AluminiumCharacterization (materials science)Atomic layer depositionScanning transmission electron microscopyTransmission electron microscopyNanotechnologyThin filmComposite materialCatalysisChemistryBiochemistrySemiconductor materials and devicesThermal Expansion and Ionic ConductivityElectronic and Structural Properties of Oxides