Determining intrinsic sensitivity and the role of multiple scattering in speckle metrology
Morgan Facchin, Saba N. Khan, Kishan Dholakia, Graham D. Bruce
Topics & Concepts
Speckle patternMetrologyMetric (unit)Sensitivity (control systems)OpticsScatteringPhysicsField (mathematics)Speckle noiseComputer scienceElectronic engineeringEngineeringMathematicsOperations managementPure mathematicsOptical Coherence Tomography ApplicationsOptical measurement and interference techniquesSurface Roughness and Optical Measurements