Spectroscopic ellipsometry study of dielectric functions of Ag films and chemically deposited layers of Ag nanoparticles on silicon
V. A. Tolmachev, Е. В. Гущина, I.A. Nyapshaev, Yu. A. Zharova
Topics & Concepts
DielectricEllipsometryMaterials scienceDrude modelSubstrate (aquarium)Thin filmNanoparticleSiliconSputter depositionPlasmonAnalytical Chemistry (journal)OpticsMolecular physicsSputteringNanotechnologyOptoelectronicsChemistryPhysicsOceanographyChromatographyGeologyGold and Silver Nanoparticles Synthesis and ApplicationsSilicon Nanostructures and PhotoluminescenceThin-Film Transistor Technologies