A rail defect detection framework under class-imbalanced conditions based on improved you only look once network
Yu Ding, Qin Zhao, Tianhao Li, Chen Lü, Laifa Tao, Jian Ma
Topics & Concepts
Computer scienceClass (philosophy)Artificial intelligenceData miningMachine learningInfrastructure Maintenance and MonitoringVehicle License Plate RecognitionIndustrial Vision Systems and Defect Detection