Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals
Noopur Jain, Yansong Hao, Urvi Parekh, Martin Kaltenegger, Adrián Pedrazo‐Tardajos, Roberto Lazzaroni, Roland Resel, Yves Geerts, Sara Bals, Sandra Van Aert
Topics & Concepts
Materials scienceElectron diffractionGrapheneDiffractionTransmission electron microscopyRadiation damageElectron beam processingIrradiationElectronCathode rayOpticsOptoelectronicsNanotechnologyRadiationPhysicsQuantum mechanicsNuclear physicsAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesIntegrated Circuits and Semiconductor Failure Analysis