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A Transimpedance-to-Noise Optimized Analog Front-End With High PSRR for Pulsed ToF Lidar Receivers

Farzad Khoeini, Bahareh Hadidian, Keshu Zhang, Ehsan Afshari

2021IEEE Transactions on Circuits and Systems I Regular Papers28 citationsDOI

Abstract

This paper presents a transimpedance-to-noise optimization approach for design of a resistive shunt-feedback TIA. This optimization offers an enhancement in the transimpedance and a noise performance very close to the theoretical minimum noise of the TIA. In addition, the transimpedance-to-noise optimization approach results in a small front-end FET size which enables a further reduction in power and area. Moreover, this approach enables using a fewer number of stages in the receiver chain which makes a high PSRR feasible and obviates the necessity for using an offset cancellation circuitry. Building on this approach, a fully differential analog front-end including a resistive shunt-feedback TIA and a post amplifier (PA) for time-of-flight (ToF) Lidar receivers is designed and implemented, achieving 94dB Ω transimpedance gain, 71nA input-referred rms noise current, -3dB bandwidth of 340MHz, and power supply rejection ratio (PSRR) of more than 87dB in a 0.11 μm CMOS process. The associated DC power consumption is 19.4mW with V <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">DD</sub> of 1.8V. Moreover, a push-pull buffer with 1V output swing is integrated for driving 50 Ω loads, such as off-chip time discriminators, which also additionally amplifies the signal with a gain of 5dB while consuming an extra 20.9mW of DC power. The whole chip (excluding pads) occupies 210 μm × 110 μm in area.

Topics & Concepts

Transimpedance amplifierPower supply rejection ratioCMOSAnalog front-endElectronic engineeringElectrical engineeringNoise figureComputer scienceAmplifierBandwidth (computing)EngineeringOperational amplifierTelecommunicationsAdvanced Optical Sensing TechnologiesIntegrated Circuits and Semiconductor Failure AnalysisNear-Field Optical Microscopy
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