A novel deep learning motivated data augmentation system based on defect segmentation requirements
Shuanlong Niu, Yaru Peng, Bin Li, Yuanhong Qiu, Tongzhi Niu, Weifeng Li
Topics & Concepts
OverfittingSegmentationComputer scienceArtificial intelligenceConvolutional neural networkDeep learningPattern recognition (psychology)Image segmentationIntersection (aeronautics)Generalizability theoryGeneralizationMachine learningData miningArtificial neural networkEngineeringMathematicsMathematical analysisAerospace engineeringStatisticsIndustrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesSurface Roughness and Optical Measurements