An efficient stacking model with label selection for multi-label classification
Yannan Chen, Wei Weng, Shunxiang Wu, Bai-Hua Chen, Yuling Fan, Jinghua Liu
Topics & Concepts
Computer scienceStackingBinary numberRelevance (law)Benchmark (surveying)Artificial intelligenceMulti-label classificationFeature selectionBinary classificationExploitSelection (genetic algorithm)Machine learningFeature (linguistics)Pattern recognition (psychology)Layer (electronics)Construct (python library)Data miningSupport vector machineMathematicsComputer securityNuclear magnetic resonanceGeodesyChemistryArithmeticGeographyLawPolitical sciencePhilosophyProgramming languagePhysicsLinguisticsOrganic chemistryText and Document Classification TechnologiesImage Retrieval and Classification TechniquesAdvanced Image and Video Retrieval Techniques