Degradation mechanisms of SiC/BN/SiC after low temperature humidity exposure
Oriol Gavalda‐Diaz, Katharina Marquardt, Stephen Harris, Louise Gale, Luc Vandeperre, Eduardo Saiz, Finn Giuliani
Topics & Concepts
Materials scienceHumidityDegradation (telecommunications)Drop (telecommunication)Composite materialThermalWork (physics)MeteorologyThermodynamicsTelecommunicationsPhysicsComputer scienceAdvanced ceramic materials synthesisAluminum Alloys Composites PropertiesSilicon Carbide Semiconductor Technologies