Determination of effective capacitance and film thickness from constant-phase-element parameters
Bryan Hirschorn, Mark E. Orazem, Bernard Tribollet, Vincent Vivier, Isabelle Frateur, Marco Musiani
Topics & Concepts
CapacitanceConstant phase elementConstant (computer programming)Materials sciencePhase (matter)Range (aeronautics)Electrical resistivity and conductivityCapacitance probeDistribution (mathematics)MechanicsMathematical analysisMathematicsComposite materialChemistryPhysicsElectrodeComputer scienceElectrochemistryPhysical chemistryDielectric spectroscopyQuantum mechanicsOrganic chemistryProgramming languageNon-Destructive Testing TechniquesSmart Materials for ConstructionAnodic Oxide Films and Nanostructures