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Origin and Generation Process of a Triangular Single Shockley Stacking Fault Expanding from the Surface Side in 4H-SiC PIN Diodes

Chiharu Ota, Johji Nishio, Aoi Okada, Ryosuke Iijima

2021Journal of Electronic Materials21 citationsDOI

Topics & Concepts

Burgers vectorDislocationStacking faultMaterials scienceEpitaxySubstrate (aquarium)DiodeCrystallographyStackingOptoelectronicsTransmission electron microscopyElectroluminescenceOpticsCondensed matter physicsComposite materialChemistryNanotechnologyLayer (electronics)PhysicsNuclear magnetic resonanceGeologyOceanographySilicon Carbide Semiconductor TechnologiesElectromagnetic Compatibility and Noise SuppressionSemiconductor materials and devices
Origin and Generation Process of a Triangular Single Shockley Stacking Fault Expanding from the Surface Side in 4H-SiC PIN Diodes | Litcius