How to report and benchmark emerging field-effect transistors
Zhihui Cheng, Chin‐Sheng Pang, Peiqi Wang, Son Thai Le, Yanqing Wu, Davood Shahrjerdi, Iuliana Radu, Max C. Lemme, Lian‐Mao Peng, Xiangfeng Duan, Zhihong Chen, Joerg Appenzeller, Steven J. Koester, Eric Pop, Aaron D. Franklin, Curt A. Richter
Topics & Concepts
BenchmarkingBenchmark (surveying)Field (mathematics)Process (computing)Computer scienceField-effect transistorTransistorData scienceNanotechnologyBusinessMaterials scienceEngineeringElectrical engineeringMathematicsMarketingVoltageGeographyGeodesyPure mathematicsOperating system2D Materials and ApplicationsElectronic and Structural Properties of OxidesFerroelectric and Negative Capacitance Devices