Masked autoencoder with dynamic multi-loss adaptation mechanism for few shot wafer map pattern recognition
Qi Liang, Jian Zhou, Yonglin Wang
Topics & Concepts
Computer scienceAutoencoderLeverage (statistics)Artificial intelligenceClassifier (UML)Machine learningPattern recognition (psychology)Feature (linguistics)Deep learningPhilosophyLinguisticsIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography Techniques