Defect tolerant fatigue assessment of AM materials: Size effect and probabilistic prospects
Xiaopeng Niu, Shun‐Peng Zhu, Jin-Chao He, Ding Liao, José A.F.O. Correia, Filippo Berto, Qingyuan Wang
Topics & Concepts
Fatigue limitProbabilistic logicStructural engineeringFatigue testingMaterials scienceScale (ratio)Reliability engineeringComputer scienceEngineeringArtificial intelligencePhysicsQuantum mechanicsAdditive Manufacturing Materials and ProcessesAdditive Manufacturing and 3D Printing TechnologiesManufacturing Process and Optimization