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Probabilistic Analysis for Remaining Useful Life Prediction and Reliability Assessment

Teng Wang, Zheng Liu, Min Liao, Nezih Mrad, Guoliang Lu

2020IEEE Transactions on Reliability31 citationsDOI

Abstract

Although the importance of remaining useful life (RUL) prediction is widely recognized in industries, its implementation in real scenarios is highly restricted by the complexity of the degradation mechanism, uncertainty of machinery, and insufficiency of prior knowledge. To address such a challenge, this article proposes a model-based framework, which has the capability to integrate multiple predictive models via a probabilistic mechanism. When a new observation is fed into each predictive model, the posterior distribution of each model will be updated via Bayesian inference. Then, a grid-sampling strategy is applied to their posterior distributions for identifying the “peak” and “profile,” which are used for RUL prediction and reliability assessment, respectively. The effectiveness of this framework is validated with the experiments on a set of steel tension specimens. Theoretical interpretations and comparative studies demonstrate the superiority of the proposed framework. Besides, the proposed framework can not only reduce human workload on trivial parameter setting but also be effective with insufficient prior knowledge, making the intelligent RUL prediction easier.

Topics & Concepts

Reliability (semiconductor)Probabilistic logicComputer scienceReliability engineeringBayesian probabilityWorkloadInferencePosterior probabilityData miningPredictive inferenceBayesian inferenceMachine learningGridSet (abstract data type)Artificial intelligenceEngineeringFrequentist inferenceMathematicsPhysicsOperating systemProgramming languagePower (physics)GeometryQuantum mechanicsReliability and Maintenance OptimizationFatigue and fracture mechanicsNon-Destructive Testing Techniques