Gate leakage current sensing for in situ temperature monitoring of p-GaN gate HEMTs
Alessandro Borghese, Michele Riccio, Giorgia Longobardi, Luca Maresca, Giovanni Breglio, Andrea Irace
Topics & Concepts
SpiceLeakage (economics)Materials scienceOptoelectronicsGate voltageElectronic engineeringGate driverVoltageElectrical engineeringEngineeringTransistorEconomicsMacroeconomicsGaN-based semiconductor devices and materialsSilicon Carbide Semiconductor TechnologiesAdvancements in Semiconductor Devices and Circuit Design