Litcius/Paper detail

BTI saturation and universal relaxation in SiC power MOSFETs

Luis Sánchez, Eliana Acurio, Felice Crupi, Susanna Reggiani, Gaudenzio Meneghesso

2020Microelectronics Reliability11 citationsDOIOpen Access PDF

Topics & Concepts

TrappingMaterials scienceSaturation (graph theory)Threshold voltageArrhenius equationArrhenius plotStress (linguistics)Power lawActivation energyRelaxation (psychology)Condensed matter physicsStress relaxationVoltageAnalytical Chemistry (journal)Electrical engineeringChemistryComposite materialPhysicsTransistorPhilosophyCombinatoricsCreepPsychologyStatisticsSocial psychologyBiologyEngineeringOrganic chemistryChromatographyLinguisticsEcologyMathematicsSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit Design