Spatiospectral characterization of ultrafast pulse-beams by multiplexed broadband ptychography
David Goldberger, David Schmidt, Jonathan Barolak, Bojana Ivanic, Charles G. Durfee, Daniel E. Adams
Abstract
Ultrafast pulse-beam characterization is critical for diverse scientific and industrial applications from micromachining to generating the highest intensity laser pulses. The four-dimensional structure of a pulse-beam, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mover> <mml:mi>E</mml:mi> <mml:mo>~</mml:mo> </mml:mover> </mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mi>x</mml:mi> <mml:mo>,</mml:mo> <mml:mi>y</mml:mi> <mml:mo>,</mml:mo> <mml:mi>z</mml:mi> <mml:mo>,</mml:mo> <mml:mi>ω</mml:mi> <mml:mo stretchy="false">)</mml:mo> </mml:math> , can be fully characterized by coupling spatiospectral metrology with spectral phase measurement. When temporal pulse dynamics are not of primary interest, spatiospectral characterization of a pulse-beam provides crucial information even without spectral phase. Here we demonstrate spatiospectral characterization of pulse-beams via multiplexed broadband ptychography. The complex spatial profiles of multiple spectral components, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mover> <mml:mi>E</mml:mi> <mml:mo>~</mml:mo> </mml:mover> </mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mi>x</mml:mi> <mml:mo>,</mml:mo> <mml:mi>y</mml:mi> <mml:mo>,</mml:mo> <mml:mi>ω</mml:mi> <mml:mo stretchy="false">)</mml:mo> </mml:math> , from modelocked Ti:sapphire and from extreme ultra-violet pulse-beams are reconstructed with minimum intervening optics and no refocusing. Critically, our technique does not require spectral filters, interferometers, or reference pulses.