Degradation of CIP by circulating water-electrode DBD plasma: Degradation performance, key reactive species, and pathway analysis
Xiaomei Yao, Minghao Xu, Xian Cheng, He Zhang, Heng Zhang, Jixian Gao
Topics & Concepts
Degradation (telecommunications)PlasmaChemistryElectrodeKey (lock)Chemical engineeringComputer scienceTelecommunicationsEngineeringPhysical chemistryQuantum mechanicsComputer securityPhysicsPlasma Applications and DiagnosticsPlasma Diagnostics and ApplicationsSurface Modification and Superhydrophobicity