Fault detection based on one-class deep learning for manufacturing applications limited to an imbalanced database
Jeongsu Lee, Young Chul Lee, Jeong Tae Kim
Topics & Concepts
Artificial intelligenceDeep learningMachine learningComputer scienceResidualClass (philosophy)Fault detection and isolationFault (geology)Production (economics)Feature (linguistics)Pattern recognition (psychology)Data miningAlgorithmGeologyLinguisticsEconomicsMacroeconomicsSeismologyPhilosophyActuatorAnomaly Detection Techniques and ApplicationsImbalanced Data Classification TechniquesFault Detection and Control Systems