Prediction of IGBT junction temperature using improved cuckoo search-based extreme learning machine
Boying Liu, Guolong Chen, Hsiung‐Cheng Lin, Weipeng Zhang, Jiaqi Liu
Topics & Concepts
Cuckoo searchInsulated-gate bipolar transistorJunction temperatureExtreme learning machineSaturation currentCommon emitterReliability (semiconductor)VoltageTransistorPower (physics)Artificial intelligenceComputer scienceMaterials scienceElectronic engineeringAlgorithmElectrical engineeringOptoelectronicsEngineeringArtificial neural networkPhysicsQuantum mechanicsParticle swarm optimizationSilicon Carbide Semiconductor TechnologiesAdvancements in Semiconductor Devices and Circuit DesignMachine Learning and ELM