Structural characterization of polycrystalline thin films by X-ray diffraction techniques
Akhilesh Pandey, Sandeep Dalal, Shankar Dutta, Ambesh Dixit
Topics & Concepts
CrystalliteMaterials scienceThin filmDiffractionCrystallinityX-ray crystallographyTexture (cosmology)Characterization (materials science)DopingCrystallographyAnalytical Chemistry (journal)Composite materialOpticsOptoelectronicsNanotechnologyMetallurgyComputer sciencePhysicsChemistryArtificial intelligenceChromatographyImage (mathematics)X-ray Diffraction in CrystallographyFerroelectric and Piezoelectric MaterialsMetal and Thin Film Mechanics