Litcius/Paper detail

MemSeg: A semi-supervised method for image surface defect detection using differences and commonalities

Minghui Yang, Peng Wu, Hui Feng

2023Engineering Applications of Artificial Intelligence227 citationsDOI

Topics & Concepts

Computer scienceArtificial intelligenceHyperplaneTask (project management)Perspective (graphical)InferencePattern recognition (psychology)SegmentationImage (mathematics)PixelMachine learningManagementGeometryEconomicsMathematicsIndustrial Vision Systems and Defect DetectionAdvanced Neural Network ApplicationsImage and Object Detection Techniques
MemSeg: A semi-supervised method for image surface defect detection using differences and commonalities | Litcius