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Exploring model complexity in machine learned potentials for simulated properties

Andrew Rohskopf, James Goff, Dionysios Sema, Kiarash Gordiz, Ngoc Cuong Nguyen, Asegun Henry, Aidan P. Thompson, Mitchell Wood

2023Journal of materials research/Pratt's guide to venture capital sources11 citationsDOIOpen Access PDF

Abstract

Abstract Machine learning (ML) enables the development of interatomic potentials with the accuracy of first principles methods while retaining the speed and parallel efficiency of empirical potentials. While ML potentials traditionally use atom-centered descriptors as inputs, different models such as linear regression and neural networks map descriptors to atomic energies and forces. This begs the question: what is the improvement in accuracy due to model complexity irrespective of descriptors? We curate three datasets to investigate this question in terms of ab initio energy and force errors: (1) solid and liquid silicon, (2) gallium nitride, and (3) the superionic conductor Li $$_{10}$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:msub> <mml:mrow/> <mml:mn>10</mml:mn> </mml:msub> </mml:math> Ge(PS $$_{6}$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:msub> <mml:mrow/> <mml:mn>6</mml:mn> </mml:msub> </mml:math> ) $$_{2}$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:msub> <mml:mrow/> <mml:mn>2</mml:mn> </mml:msub> </mml:math> (LGPS). We further investigate how these errors affect simulated properties and verify if the improvement in fitting errors corresponds to measurable improvement in property prediction. By assessing different models, we observe correlations between fitting quantity (e.g. atomic force) error and simulated property error with respect to ab initio values. Graphical abstract

Topics & Concepts

AlgorithmMachine learningComputer scienceArtificial intelligenceAb initioInteratomic potentialMaterials sciencePhysicsComputational chemistryMolecular dynamicsChemistryQuantum mechanicsMachine Learning in Materials ScienceFuel Cells and Related MaterialsX-ray Diffraction in Crystallography
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