Explaining Image Classifiers Using Statistical Fault Localization
Youcheng Sun, Hana Chockler, Xiaowei Huang, Daniel Kroening
Topics & Concepts
Computer scienceBenchmark (surveying)Ranking (information retrieval)Set (abstract data type)Black boxArtificial intelligenceDeep neural networksGround truthArtificial neural networkImage (mathematics)Machine learningFault (geology)Pattern recognition (psychology)Data miningProgramming languageGeographyGeologySeismologyGeodesyAdversarial Robustness in Machine LearningExplainable Artificial Intelligence (XAI)Machine Learning and Data Classification