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A label information vector generative zero-shot model for the diagnosis of compound faults

Juan Xu, Kang Li, Yuqi Fan, Xiaohui Yuan

2023Expert Systems with Applications48 citationsDOI

Topics & Concepts

Fault (geology)Computer scienceSet (abstract data type)Artificial intelligencePattern recognition (psychology)Fault modelAdversarial systemData miningTraining setFault coverageStuck-at faultFault detection and isolationAlgorithmEngineeringSeismologyElectrical engineeringProgramming languageGeologyElectronic circuitActuatorAnomaly Detection Techniques and ApplicationsMachine Fault Diagnosis TechniquesImage Processing Techniques and Applications
A label information vector generative zero-shot model for the diagnosis of compound faults | Litcius