Transmission x-ray microscopy and its applications in battery material research—a short review
Stephanie Spence, Wah-Keat Lee, Feng Lin, Xianghui Xiao
Abstract
Transmission x-ray microscopy (TXM), which can provide morphological and chemical structural information inside of battery component materials at tens of nanometer scale, has become a powerful tool in battery research. This article presents a short review of the TXM, including its instrumentation, battery research applications, and the practical sample preparation and data analysis in the TXM applications. A brief discussion on the challenges and opportunities in the TXM applications is presented at the end.
Topics & Concepts
Battery (electricity)Materials scienceNanometreInstrumentation (computer programming)Transmission (telecommunications)MicroscopyNanotechnologyX-rayOpticsComputer scienceTelecommunicationsPhysicsOperating systemPower (physics)Composite materialQuantum mechanicsX-ray Diffraction in CrystallographyElectron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and Applications