Litcius/Paper detail

Electrical Properties of MOS Capacitor with TiO2/SiO2 Dielectric Layer

Saime Şebnem Çetin, Halil İbrahim Efkere, Tunc Sertel, A. Tataroğlu, Süleyman Özçelik

2020Silicon16 citationsDOI

Topics & Concepts

Materials scienceCapacitorDielectricOptoelectronicsFourier transform infrared spectroscopyWaferSputter depositionOxideLayer (electronics)UltravioletEquivalent series resistanceSemiconductorSputteringThin filmComposite materialOpticsNanotechnologyVoltageElectrical engineeringMetallurgyPhysicsEngineeringSemiconductor materials and devicesSemiconductor materials and interfacesSilicon Nanostructures and Photoluminescence