Investigation of negative DIBL effect for ferroelectric-based FETs to improve MOSFETs and CMOS circuits
Weixing Huang, Huilong Zhu, Yongkui Zhang, Zhenhua Wu, Kunpeng Jia, Xiaogen Yin, Yangyang Li, Chen Li, Xuezheng Ai, Qiang Huo, Junfeng Li
Topics & Concepts
CMOSTransistorDrain-induced barrier loweringMaterials scienceRing oscillatorNegative impedance converterMOSFETCapacitanceField-effect transistorSpiceElectrical engineeringStatic random-access memoryElectronic engineeringOptoelectronicsEngineeringVoltagePhysicsVoltage sourceElectrodeQuantum mechanicsFerroelectric and Negative Capacitance DevicesSemiconductor materials and devicesAdvanced Memory and Neural Computing