Uncertain accelerated degradation modeling and analysis considering epistemic uncertainties in time and unit dimension
Jipeng Wu, Rui Kang, Xiaoyang Li
Topics & Concepts
Reliability (semiconductor)Uncertainty quantificationDimension (graph theory)Degradation (telecommunications)Uncertainty analysisComputer scienceUnit (ring theory)Reliability engineeringMathematicsEngineeringMachine learningSimulationPower (physics)Quantum mechanicsTelecommunicationsPhysicsPure mathematicsMathematics educationReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsSoftware Reliability and Analysis Research