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CBDC-PUF: A Novel Physical Unclonable Function Design Framework Utilizing Configurable Butterfly Delay Chain Against Modeling Attack

Yanjiang Liu, Junwei Li, Tongzhou Qu, Zibin Dai

2023ACM Transactions on Design Automation of Electronic Systems10 citationsDOI

Abstract

Physical unclonable function (PUF) is a promising security-based primitive, which provides an extremely large number of responses for key generation and authentication applications. Various PUFs have been developed as central building blocks in cryptographic protocols and security architectures, however, the existing PUFs and their improvements are still vulnerable to modeling attacks (MA) with refined machine learning algorithms. In this article, a configurable butterfly delay chain-based PUF design framework is proposed to meet the requirements of randomness, reliability, uniqueness, and MA-resistance metrics. A configurable butterfly delay chain is introduced to create multiple pairs of symmetric paths and a strong PUF relying on the intrinsic delay fluctuations of two identical paths is built. Furthermore, a secure hash function is used to insert non-linearities into the PUF, and a BCH-based error correction algorithm is utilized to recover the actual responses under noisy environments. The proposed PUF is implemented on Xilinx FPGAs and three machine learning algorithms are used to evaluate the resistance against MA. Experimental results show that the randomness, reliability, and uniqueness of the proposed PUF are close to the ideal value (49.6%, 99.9%, and 49.9%, respectively), and the prediction accuracy reaches 50% that indicating a desirable resilient to MA.

Topics & Concepts

Physical unclonable functionComputer scienceRandomnessHash functionAuthentication (law)CryptographyReliability (semiconductor)Embedded systemArbiterField-programmable gate arrayAlgorithmComputer hardwareComputer securityMathematicsPhysicsPower (physics)StatisticsQuantum mechanicsPhysical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure AnalysisNeuroscience and Neural Engineering
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