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Frequency and voltage-dependent dielectric spectroscopy characterization of Al/(Coumarin-PVA)/p-Si structures

S. Demirezen, Seçkin Altındal Yerişkin

2021Journal of Materials Science Materials in Electronics39 citationsDOI

Topics & Concepts

Materials scienceDielectricDissipation factorPolarization (electrochemistry)Electric fieldDipoleEquivalent series resistanceDielectric lossAnalytical Chemistry (journal)Dielectric spectroscopyElectrical resistivity and conductivityCondensed matter physicsConductivityVoltageNuclear magnetic resonancePhysicsElectrodeOptoelectronicsChemistryElectrochemistryPhysical chemistryQuantum mechanicsChromatographySemiconductor materials and interfacesSemiconductor materials and devicesSilicon Nanostructures and Photoluminescence
Frequency and voltage-dependent dielectric spectroscopy characterization of Al/(Coumarin-PVA)/p-Si structures | Litcius