Litcius/Paper detail

Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography

Alexey Moskovchenko, Michal Švantner, В. П. Вавилов, A. O. Chulkov

2022NDT & E International32 citationsDOI

Topics & Concepts

ThermographyPoint of deliveryRange (aeronautics)Function (biology)Statistical powerLimit (mathematics)Nondestructive testingSIGNAL (programming language)Materials scienceBiological systemMathematicsStatisticsInfraredComputer scienceOpticsPhysicsMathematical analysisEvolutionary biologyAgronomyProgramming languageComposite materialQuantum mechanicsBiologyThermography and Photoacoustic TechniquesCalibration and Measurement TechniquesAdditive Manufacturing Materials and Processes
Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography | Litcius