Unveiling the high-temperature degradation mechanism of solid oxide electrolysis cells through direct imaging of nanoscale interfacial phenomena
Haneul Choi, Jisu Shin, Changho Yeon, Sun‐Young Park, Shin-Tae Bae, Ji Wan Kim, Jong‐Ho Lee, Jin‐Woo Park, Chan‐Woo Lee, Kyung Joong Yoon, Hye Jung Chang
Abstract
Advanced transmission electron microscopy analysis uncovers the fundamental mechanisms behind nanometer-scale interfacial degradation phenomena in high-temperature solid oxide electrolysis cells.
Topics & Concepts
Nanoscopic scaleMechanism (biology)Materials scienceDegradation (telecommunications)ElectrolysisNanotechnologyOxideChemical engineeringChemistryMetallurgyElectrical engineeringPhysicsPhysical chemistryElectrodeEngineeringElectrolyteQuantum mechanicsAdvancements in Solid Oxide Fuel CellsNuclear Materials and PropertiesMolten salt chemistry and electrochemical processes