Advanced quality control for probe precision forming to empower virtual vertical integration for semiconductor manufacturing
Wenhan Fu, Chen–Fu Chien, Chi-Hang Chen
Topics & Concepts
Integrated circuitSemiconductor device fabricationProcess variableProcess (computing)Quality (philosophy)Reliability engineeringDie (integrated circuit)Design of experimentsIntegrated circuit packagingComputer scienceElectronic engineeringEngineeringMechanical engineeringMathematicsElectrical engineeringOperating systemWaferPhilosophyStatisticsEpistemologyIndustrial Vision Systems and Defect DetectionAdvanced Measurement and Metrology TechniquesIntegrated Circuits and Semiconductor Failure Analysis