Modeling and Simulating Electromagnetic Fault Injection

Mathieu Dumont, M. Lisart, Philippe Maurine

2020IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems44 citationsDOI

Abstract

Electromagnetic fault injection (EMFI) has recently gained popularity as a mean to induce faults because of its inherent advantages. Despite this popularity, there is only a little information on how EMFI generates faults. Within this context, this article aims at filling this lack by proposing a complete understanding and modeling of EM induction on integrated circuits (ICs). The presented model is confronted to experiments to endorse its soundness.

Topics & Concepts

SoundnessPopularityContext (archaeology)Fault (geology)Fault injectionComputer scienceReliability engineeringEngineeringPsychologyProgramming languageHistoryGeologySocial psychologySeismologySoftwareArchaeologyIntegrated Circuits and Semiconductor Failure AnalysisElectrostatic Discharge in ElectronicsPhysical Unclonable Functions (PUFs) and Hardware Security