An automatic defect detection method for TO56 semiconductor laser using deep convolutional neural network
Hang Zhang, Rong Li, Dexiang Zou, Jian Liu, Ning Chen
Topics & Concepts
Artificial intelligenceSegmentationComputer scienceConvolutional neural networkReliability (semiconductor)Stage (stratigraphy)Computer visionObject detectionPattern recognition (psychology)Image segmentationLaserOpticsPaleontologyBiologyQuantum mechanicsPower (physics)PhysicsIndustrial Vision Systems and Defect DetectionSurface Roughness and Optical MeasurementsIntegrated Circuits and Semiconductor Failure Analysis