Recovery investigation of NBTI-induced traps in n-MOSFET devices
Boualem Djezzar, Abdelmadjid Benabdelmoumene, Boumediene Zatout, Dhiaelhak Messaoud, Amel Chenouf, Hakim Tahi, Mohamed Boubaaya, Hakima Timlelt
Topics & Concepts
Negative-bias temperature instabilityMOSFETThreshold voltageMaterials scienceStress (linguistics)OxideTransistorPhase (matter)Field-effect transistorOptoelectronicsCondensed matter physicsVoltageElectrical engineeringChemistryPhysicsMetallurgyEngineeringPhilosophyOrganic chemistryLinguisticsSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignSilicon Carbide Semiconductor Technologies