Defect Engineering in van der Waals Layer‐Structured Bi <sub>2</sub> Te <sub>3</sub> ‐Based Materials
Siqi Liu, Wei‐Di Liu, Wanyu Lyu, Han Gao, Dmitri Golberg, Zhi‐Gang Chen
Abstract
ABSTRACT Bi 2 Te 3 ‐based materials are widely utilised in various applications, including biosensors, photocatalysts, photodetectors, and thermoelectrics, due to their unique electrical, thermal, and mechanical properties. Defect engineering has emerged as a powerful strategy to enhance these properties further. This review begins by categorising the types of defects in van der Waals layer‐structured Bi 2 Te 3 ‐based materials into zero‐dimensional, one‐dimensional, two‐dimensional, and three‐dimensional classes. It then presents a comprehensive overview of the formation mechanisms and characterisation techniques for these defects. The effects of defects on the electrical, thermal, and mechanical properties of Bi 2 Te 3 ‐based materials are systematically analysed. Overall, this review serves as a detailed guide to defect engineering in van der Waals layer‐structured Bi 2 Te 3 ‐based materials and provides valuable insights for the future design and development of functional materials.