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Interfacial modification mechanism of ALD-SiO2/4H-SiC heterojunction by synergistic nitrogen–oxygen-atmosphere RTA

Feiqing Huang, Li Zheng, Xinhong Cheng, Limin Yan, Jianhao Huang, Zhongyu Liu

2022Applied Physics A10 citationsDOI

Topics & Concepts

PassivationAtomic layer depositionHeterojunctionDangling bondAnnealing (glass)OxygenMaterials scienceOxideChemical engineeringNitrogenNanotechnologySiliconChemistryThin filmOptoelectronicsLayer (electronics)Composite materialOrganic chemistryMetallurgyEngineeringSemiconductor materials and devicesSilicon Carbide Semiconductor TechnologiesDiamond and Carbon-based Materials Research
Interfacial modification mechanism of ALD-SiO2/4H-SiC heterojunction by synergistic nitrogen–oxygen-atmosphere RTA | Litcius