In-situ sub-aperture stitching measurement based on monoscopic phase measuring deflectometry
Ting Chen, Yunuo Chen, Wei Lang, Xiangchao Zhang, Wei Wang, Min Xu
Topics & Concepts
Image stitchingAperture (computer memory)CalibrationOpticsComputer sciencePhase (matter)Computer visionPhysicsAcousticsQuantum mechanicsOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesAdvanced Surface Polishing Techniques