Litcius/Paper detail

Intelligent tool wear monitoring based on parallel residual and stacked bidirectional long short-term memory network

Xianli Liu, Shaoyang Liu, Xuebing Li, Bowen Zhang, Caixu Yue, Steven Y. Liang

2021Journal of Manufacturing Systems130 citationsDOI

Topics & Concepts

ResidualSmoothingComputer scienceTerm (time)Feature (linguistics)Condition monitoringGeneralizationEngineeringAlgorithmComputer visionMathematicsMathematical analysisPhilosophyPhysicsLinguisticsQuantum mechanicsElectrical engineeringAdvanced machining processes and optimizationMachine Fault Diagnosis TechniquesAdvanced Machining and Optimization Techniques
Intelligent tool wear monitoring based on parallel residual and stacked bidirectional long short-term memory network | Litcius