Litcius/Paper detail

Using HJ-CCD image and PLS algorithm to estimate the yield of field-grown winter wheat

Pengpeng Zhang, Xinxing Zhou, Zhixiang Wang, Wei Mao, Wenxi Li, Fei Yun, Wenshan Guo, Changwei Tan

2020Scientific Reports32 citationsDOIOpen Access PDF

Abstract

Abstract Remote sensing has been used as an important means of estimating crop production, especially for the estimation of crop yield in the middle and late growth period. In order to further improve the accuracy of estimating winter wheat yield through remote sensing, this study analyzed the quantitative relationship between satellite remote sensing variables obtained from HJ-CCD images and the winter wheat yield, and used the partial least square (PLS) algorithm to construct and validate the multivariate remote sensing models of estimating the yield. The research showed a close relationship between yield and most remote sensing variables. Significant multiple correlations were also recorded between most remote sensing variables. The optimal principal components numbers of PLS models used to estimate yield were 4. Green normalized difference vegetation index (GNDVI), optimized soil-adjusted vegetation index (OSAVI), normalized difference vegetation index (NDVI) and plant senescence reflectance index (PSRI) were sensitive variables for yield remote sensing estimation. Through model development and model validation evaluation, the yield estimation model’s coefficients of determination (R 2 ) were 0.81 and 0.74 respectively. The root mean square error (RMSE) were 693.9 kg ha −1 and 786.5 kg ha −1 . It showed that the PLS algorithm model estimates the yield better than the linear regression (LR) and principal components analysis (PCA) algorithms. The estimation accuracy was improved by more than 20% than the LR algorithm, and was 13% higher than the PCA algorithm. The results could provide an effective way to improve the estimation accuracy of winter wheat yield by remote sensing, and was conducive to large-area application and promotion.

Topics & Concepts

Normalized Difference Vegetation IndexPrincipal component analysisMean squared errorYield (engineering)Remote sensingVegetation (pathology)MathematicsLinear regressionMultivariate statisticsRegression analysisEnhanced vegetation indexStatisticsVegetation IndexEnvironmental scienceLeaf area indexAgronomyGeographyPathologyMedicineMetallurgyBiologyMaterials scienceRemote Sensing in AgricultureRemote Sensing and LiDAR ApplicationsLeaf Properties and Growth Measurement