Correction of the air refractive index using a two-color method for absolute distance measurement without a dead zone
Haoran Gao, Liandong Yu, Xin Xu, Xueying Jin, Yang Lü, Dian Bian, Renhao Zheng
Abstract
In the fields of satellite formation, large-scale manufacturing, and ultra-precision machining, high-precision ranging based on the femtosecond laser is one of the necessary technologies. However, the fluctuations of the air refractive index and the limited tuning range of repetition rate restrict the measurement precision and range. Using only one femtosecond comb that corrects the air refractive index simultaneously, a method for ranging without the dead zone of measurement is described. A delay optical path is established in the ranging system to eliminate the dead zone of measurement by a comb. Meanwhile, in order to ensure the consistency of the pulse sequence between the fundamental frequency beam and the second-harmonic beam after the delay optical path, the second-harmonic beam generates on the delay optical path after the fundamental harmonic passes the long fiber. A two-color method is used to correct the effect of the air refractive index. The experimental result demonstrates the measurement precision of 7.2 µm at <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mo>∼</mml:mo> </mml:mrow> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mn>0.8</mml:mn> </mml:mrow> <mml:mspace width="thickmathspace"/> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mi mathvariant="normal">m</mml:mi> </mml:mrow> </mml:math> with correction of the air refractive index, and the precision of measurement is 8.4 µm at <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mo>∼</mml:mo> </mml:mrow> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mn>2.2</mml:mn> </mml:mrow> <mml:mspace width="thickmathspace"/> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:mi mathvariant="normal">m</mml:mi> </mml:mrow> </mml:math> . Finally, the maximum deviation between our system and the reference standard is 5.0 µm.